Test & Measurement
JEDEC Publishes GDDR7 Graphics Memory Standard
JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry has announced publication of JESD239 Graphics Double Data Rate (GDDR7) SGRAM. This groundbreaking new memory standard is available for free download from the JEDEC website.
5 min read
IEEE approves Panasonic's OFDM based Nessum as new IEEE 1901c standard
Panasonic has developed an innovative communications technology based on Wavelet orthogonal frequency division multiplexing (OFDM) method, to enable seamless communication across various mediums. IEEE Standards Association Board of Directors has approved it as the new IEEE 1901c standard. Panasonic
3 min read
Rohde & Schwarz adds eight-channel R&S MXO 5 to next-gen oscilloscopes
Rohde & Schwarz introduces the latest addition to its oscilloscope lineup, the R&S MXO 5. Leveraging the advanced MXO-EP processing ASIC technology, developed by Rohde & Schwarz and previously featured in the R&S MXO 4, the new eight-channel R&S MXO 5 oscilloscopes elevate measurement performance to
6 min read
Phased array antenna control and calibration solution for sat comm
To develop active electronically scanned arrays for satellite communications applications, Keysight is offering the Phased Array Antenna Control and Calibration solution to quickly test their designs during early validation. The range of benefits Keysight explains include: Proprietary phased a
3 min read
JEDEC publishes New Test Method to evaluate power GaN devices
JEDEC Solid State Technology Association announces the publication of JEP182: Test Method for Continuous-Switching Evaluation of Gallium Nitride Power Conversion Devices. Developed by JEDEC’s JC-70 Committee for Wide Bandgap Power Electronic Conversion Semiconductors, JEP182 is available for free do
3 min readView and share your Tek scope' waveform on the cloud
Test and measurement tool maker Tektronix has announced the cloud-based storage and visualisation software to view Tektronix Session .(tss), Waveform (.wfm), and Tektronix IS (.isf) files directly in your web browser. TekDrive offers oscilloscope-display like data visualizations to view, zoom, pan,
3 min readTUV Rheinland offering 2G, 3G, and 4G wireless testing and certification for the Indian market
TUV Rheinland India added long range testing and certification activities for the Indian market by introducing CMW 500 signalling unit and available infrastructure of its 10m anechoic chamber. TUV Rheinland India said it can now offer, complete testing & certification services for 2G, 3G, and 4G ce
4 min readThermal imaging camera for electronics design
FLIR Systems launched its new FLIR ETS320 thermal imaging product for electronics design testing in engineering benchtop environments to test and analyze the thermal characteristics of electronic components and printed circuit boards (PCBs), the FLIR ETS320 aims to advance testing and diagnosis acc
2 min readT&VS and Imperas partner in offering virtual software platform for testing
Due to the ever decreasing market-opportunity window for IoT and many such hot markets, there is a requirement to simultaneously do hardware and software development. To develop them in parallel, many of the embedded system developers are using virtual platforms to verify and validate the software b
3 min readPower semiconductor tester support GaN and SiC devics
Keithley business of Tektronix has announced the Keithley S540 Power Semiconductor Test System to perform wafer-level testing of power semiconductor devices. This new Test System is a fully-automated, 48 pin parametric test system to test power semiconductor devices and structures up to 3kV. The
2 min readToy testing & certification by TUV Rheinland in its India labs
When we talk about toy, though it is a toy, it is not a negligence market where safety is concerned. The safety is even quite important compared to many markets due to hazards they may cause to kids, if not properly designed and tested. The toy market is also a big market. There is enough market for
3 min readCAN FD test support available on Tek's MDO3000 and MDO4000C scopes
Tektronix has introduced complete CAN FD protocol trigger, decode and search solution for its MDO3000 and MDO4000C Series of mixed domain oscilloscopes. This test systems allow to help to speed up the development of CAN FD in automotives. The original CAN specification defined in the ISO 11898 st
2 min read
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