Test & Measurement

Pickering interfaces introduces high-speed PXI resolver simulation modules for enhanced servo system testing in aerospace and automotive applications

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Pickering Interfaces has announced the expansion of its 41-670 (PXI) and 43-670 (PXIe) LVDT, RVDT, and resolver simulator modules. The new modules achieve rotation speeds of up to 130kRPM, addressing the growing need for precise and reliable testing of advanced servo systems in critical industries such as automotive, aerospace, and defense.

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Modern control systems in automotive, aircraft, and defense applications increasingly use high-speed resolvers with excitation frequencies up to 80 kHz to improve signal bandwidth, reduce noise susceptibility, and enhance dynamic response. Testing embedded software with lower speed resolver simulations can result in lower fidelity and missed software bugs. The updated modules from Pickering Interfaces enable high-speed resolver simulation, ensuring accurate and reliable performance even at the highest speeds.

“Our updated family of resolver simulators uses actual transformers on board, rather than relying on FPGA approximations,” said Stephen Jenkins, Simulation Product Manager at Pickering Interfaces. “As a result, our modules deliver precise, real-world analog signals with high-resolution angle simulation, ensuring reliable performance even at the highest speeds.”

The 41-670 (PXI) and 43-670 (PXIe) modules are ideal for simulating variable differential transformers, both linear (LVDT) and rotary (RVDT) types, as well as resolvers with high-speed simulation up to 130kRPM rotation. They feature two (41/43-670-303) or four (41/43-670-301) banks, each capable of simulating the output of a single 5- or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal. This allows the module to simulate up to 4 channels of 5- or 6-wire or eight channels of 4-wire.

 

The high-channel density of the PXI modules enables the testing of multiple resolver channels in a compact footprint. With built-in relays, the 41/43-670 can also provide short or open circuits for each channel’s inputs and outputs, reducing the need for external switching for fault insertion requirements. The programmable phase delay can be used for simulating imperfect sensors and cabling, artificially offsetting single or multiple outputs.

Learn more at: www.pickeringtest.com.

 


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