yieldWerx and WATS have announced a partnership to connect board-level PCB test data with upstream semiconductor manufacturing data. Board-level and semiconductor test data are typically analyzed in isolation, which limits correlation across the product lifecycle. Linking printed circuit board assembly (PCBA) test results including in-circuit test (ICT) and functional test with wafer fabrication, wafer sort, and final test data has been particularly challenging in areas such as photonics, advanced packaging, and high-density integration.
WATS is a test data management platform for electronics manufacturers. It captures, standardizes, and analyzes high-volume test data from PCBA production, covering in-circuit test, functional test, and final test. The platform provides real-time visibility into board-level yield, anomalies, and quality metrics.
yieldWerx operates at the semiconductor level. It connects data across wafer fabrication, wafer sort, die, and packaged device test stages. Its platform supports advanced yield analysis, traceability, and root cause investigation.
The combined solution addresses the full product stack by enabling correlation between PCBA-level signals and silicon quality data. This provides improved visibility across test stages and supports analysis of yield and reliability issues.
The partnership delivers the following capabilities:
- Real-time visibility into PCBA test results for faster identification of yield and quality issues
- Improved correlation between board-level test results and upstream chip or wafer data
- Reduced time spent reconciling data from separate systems
- Earlier detection of cross-stage patterns affecting yield and reliability
- Faster root cause analysis spanning silicon, assembly, and board-level test
- Better alignment between electronics manufacturing and the semiconductor supply chain
The solution uses open architectures, APIs, and flexible deployment models to support integration without requiring large-scale system replacements.
Tom Lomsdalen, CEO of WATS, stated: “Our customers manufacture complex electronics where board-level test data alone only tells part of the story. By connecting PCBA production test data with yieldWerx's upstream semiconductor intelligence, we can give them a more complete picture of their product quality and yield.”
Aftkhar Aslam, CEO of yieldWerx, said: “Our customers have been asking for a unified view that links semiconductor yield data with downstream electronics test results, and this partnership delivers exactly that. Together, yieldWerx and WATS empower engineering teams to move faster on root cause analysis, reduce escapes, and make smarter decisions across the entire product lifecycle.”
yieldWerx is an enterprise analytics platform that connects data across the semiconductor product lifecycle from design and wafer fabrication through wafer sort, die, and packaged device test to support yield analysis, traceability, and decision-making in cloud, on-premises, and hybrid environments.
WATS, developed by Virinco, is a test data management and analytics platform for electronics manufacturing. It collects, standardizes, and analyzes data from test systems to provide real-time visibility into board-level performance across ICT, functional test, and final test operations.
Additional information is available at https://www.yieldWerx.com and https://www.Wats.com/.
