Joint standards for device ESD sensitivity testing by JEDEC and ESDA

The ESD Association and JEDEC Solid State Technology Association today announced the publication of ANSI/ESDA/JEDEC JS-002-2014 for Electrostatic Discharge Sensitivity (ESD) Testing – Charged Device Model (CDM) – Device Level. The product of a JEDEC/ESDA agreement to produce joint standards in the field of device ESD sensitivity testing, the new standard is intended to replace the existing Charged Device Model ESD standards (JESD22-C101 and ANSI/ESD S5.3.1). A complimentary download of ANSI/ESDA/JEDEC JS-002-2014 may be obtained from www.JEDEC.org or www.ESDA.org. ANSI/ESDA/JEDEC JS-002 establishes an improved procedure for testing, evaluating and classifying components and microcircuits according to their susceptibility to damage or degradation by exposure to a defined charged device model (CDM) electrostatic discharge (ESD). ESD can significantly impair the reliability and operation of solid state devices, and accurate test methodologies are critical to the industry as technology advances and device complexity increases. As was the case with the publication of their first joint ESD standard in 2010 for Human Body Model ESD testing, JEDEC and ESDA expect this harmonized test method for CDM to benefit the industry by eliminating confusion and duplication of effort in the industry. One key objective for the merger of the previously used test methods was to preserve the...