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Date: 04-03-14

64GSPS ADC and DAC semiconductor ip cores for 32nm

Analog semiconductor specialist Semtech has announced availability of its 64GSPS ADC and DAC preliminary silicon IP cores for IBM’s 32nm SOI (Silicon on Insulator) technology for SoC chip designers.

The high speed data converter IP cores are targeted high-speed telecom applications such as optical communications, radar and electronic warfare markets. Semtech says these ultra-high speed data converters enable agile operation and concurrent multi-band / multi-beam operation as well as extremely high dynamic performance ideally suited for highly oversampled systems utilizing large instantaneous bandwidth at low power and small areas. Semtech is also working ondata converter cores in 14nm FinFET expected to be available end of 2015.

“Through leveraging the IBM 32nm SOI process with its unique feature set, we are developing Advanced Cores that we believe are well-suited for meeting the challenges presented by the next step in high performance communications systems such as 400 Gb/s Optical systems and Advanced Radar systems,” said Craig Hornbuckle, Semtech’s Chief Systems Architect. “We are also seeing an expanding range of applications in the existing radio frequency communications marketplace where high-speed digital logic is replacing functions that have been traditionally performed by less flexible analog circuitry."

The ADC cores have an area of 4 mm2 and the DAC cores have an area of 2.2 mm2 . The cores include a wide tuning millimeter wave synthesizer enabling the core to tune from 42 to 68 GS/s per channel with a nominal jitter value of 45 femtoseconds root mean square. The full dual-channel 2x64 GS/s ADC core generates 128 billion analog-to-digital conversions per second, with a total power consumption of 2.1 Watts while the dual DAC consumes 1.7 Watts. The cores achieve 5.8 ENOB up to 10 GHz and SFDR greater than 43dB. In addition, the cores contain all necessary BIST and calibration eliminating the need for the user to develop sophisticated production test or mission mode calibration algorithms.

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