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  Date: 28/02/2013

Revised version of the IEEE 1800 for VLSI/hardware design is available

Accellera Systems Initiative (Accellera) has announced that they have once again partnered with the IEEE Standards Association (IEEE-SA) for the revised version of the IEEE 1800 "Standard SystemVerilog-Unified Hardware Design, Specification, and Verification Language Reference Manual", which is now available through the IEEE Get Program, which grants public access to view and download select IEEE standards at no charge.

IEEE 1800 is the third standard to be delivered in partnership with the IEEE-SA Get program, joining two others: Get IEEE 1685 Standard: IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows, and Get IEEE 1666 Standard: SystemC Language Reference Manual.

"We are pleased to once again partner with the IEEE-SA to make this important standard available to the worldwide design community," said Shishpal Rawat, chair of Accellera. "Working together, we serve the global industry to deliver standards that increase designer productivity and lower the cost of product development."

"We applaud the dedicated work of Accellera and look forward to further strengthening our partnership to make other standards available through the IEEE Get Program, which has become a key in standards adoption and implementation worldwide," said Konstantinos Karachalios, managing director of IEEE-SA. "It is through this type of collaboration that we serve industry best and truly advance technology. The market-driven effort to refine and make IEEE 1800 freely available to the world is emblematic of 'OpenStand,' a modern paradigm for global, open standards that the IEEE-SA supports. Standards such as IEEE 1800 that are developed in the spirit of the OpenStand principles are proven in their ability to accelerate cycles of technology innovation and market growth."

The free to download file for companies, universities, research institutions, and individuals worldwide in the field of VLSI design is available at http://standards.ieee.org/about/get/index.html#get1800.
Author: Srinivasa Reddy N
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