Date: 13th July 2011
New NAND flash memory wafer and package
test solutions from Advantest
Advantest Corporation has announced the availability of
two new solutions for next-generation NAND flash memory
test: the T5773 for package test and the HA5100CELL, based
on the Harmonic architecture, for wafer test. Advantest
says the tools together offer total test support for high-capacity,
high-speed next-generation NAND flash memory devices, from
the front end to the back end.
Front-End NAND Flash Test Solution with Industry-Best Parallel
Test Capacity: the HA5100CELL
The Harmonic Architecture (HA) platform is an all-in-one
wafer test solution that combines a tester and probe in
a single tool, and four test cells into one. With the capability
to test four wafers at once, the HA5100CELL is a dedicated
NAND flash memory tester which offers a reduced footprint
1/4 the size of previous systems. It's operating frequency
of 100MHz and a maximum parallel test capacity of 6,144
DUTs. This innovation deliver 50% test cost savings over
previous test cells. The HA5100CELL utilizes an Advantest-developed
contact compliance technology that enables a one-touch high-volume
solution. The HA5100ES, an engineering system for R&D
device evaluation, is also available.
Back-End NAND Flash Test Solution Offering Industry's Lowest
Test Cost: the T5773
Advantest's T5773 is a package test system for NAND flash
memory that supports high-speed interfaces for SSDs, handsets
and other applications, meeting the test needs of device
types that demand as much as 4X the test speed of previous
types. The T5773's operating frequency range is 200MHz /
400Mbps and offers a typical parallel test capacity of 768
DUTs. Additionally, the T5773's innovative design achieves
significant power and floorspace savings, helping to lower
customer test costs dramatically. Advantest also offers
the T5773ES, an engineering system for R&D use.
Key Specifications:
1. HA5100CELL:
-- Target Device: NAND flash memory (wafer test)
-- Parallel Test Capacity: 6,144 DUT (1,536 DUT x 4 stages)
-- Max. Test Speed: 100MHz
2. T5773:
-- Target Device: NAND flash memory, toggle-mode NAND flash
memory, ONFI3
NAND flash memory, mask ROM, etc. (package test)
-- Parallel Test Capacity: 768 DUT
-- Max. Test Speed: 200MHz / 400Mbps (in DDR mode)
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