Date: 7th Jun 2011
MIPI M-PHY Test Suite from Agilent
Agilent Technologies Inc. has announced a comprehensive
MIPI M-PHY test solution for mobile computing customers.
The Agilent solution suite is designed for engineers to
test turnon, debug and validate all layers of their M-PHY
devices, including physical and protocol layers, at speeds
up to 5.8 Gb/sec.
The Mobile Industry Processor Interface (MIPI) Alliance
is finalizing the M-PHY specification to allow development
of faster, more reliable high-speed interfaces for mobile
devices. M-PHY technology supports a broad range of applications,
including interfaces for monitors, cameras, audio and video
equipment, memory, power management and communication between
baseband and RFIC components.
The Agilent solution consists of oscilloscopes, protocol
analyzers and exercisers, and bit error-rate testers (BERTs)
using custom M-PHY stimulus software. Each instrument comes
with custom M-PHY-ready software to support design teams
through the entire product design process.
"Working closely with customers developing early M-PHY-based
silicon allowed us to provide robust M-PHY test solutions
even before the final specification became available,"
said Roland Scherzinger, Agilent's MIPI program manager.
"In addition, we were happy to share our experience
in testing high-speed serial technologies in the MIPI workgroups,
ensuring robust M-PHY specifications in terms of signal
integrity and testability."
For more information visit: www.agilent.com/find/MIPI.
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