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Date: 7th Jun 2011

MIPI M-PHY Test Suite from Agilent

Agilent Technologies Inc. has announced a comprehensive MIPI M-PHY test solution for mobile computing customers. The Agilent solution suite is designed for engineers to test turnon, debug and validate all layers of their M-PHY devices, including physical and protocol layers, at speeds up to 5.8 Gb/sec.

The Mobile Industry Processor Interface (MIPI) Alliance is finalizing the M-PHY specification to allow development of faster, more reliable high-speed interfaces for mobile devices. M-PHY technology supports a broad range of applications, including interfaces for monitors, cameras, audio and video equipment, memory, power management and communication between baseband and RFIC components.

The Agilent solution consists of oscilloscopes, protocol analyzers and exercisers, and bit error-rate testers (BERTs) using custom M-PHY stimulus software. Each instrument comes with custom M-PHY-ready software to support design teams through the entire product design process.

"Working closely with customers developing early M-PHY-based silicon allowed us to provide robust M-PHY test solutions even before the final specification became available," said Roland Scherzinger, Agilent's MIPI program manager. "In addition, we were happy to share our experience in testing high-speed serial technologies in the MIPI workgroups, ensuring robust M-PHY specifications in terms of signal integrity and testability."

For more information visit: www.agilent.com/find/MIPI.


 
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