Test gear for Jitter tolerance and 4Tap pre-emphasis testing for 28 Gbit/s interconnects

Anritsu Company has introduced jitter tolerance and 4Tap pre-emphasis test solution specifically designed to test signal integrity of high-speed interconnects up to 28 Gbit/s such as Infiniband 26G-IB-EDR, CEI-25G, CEI-28G-VSR, PCI Express, SAS, SATA, FB-DIMM, USB 3.0 and Display Port, the solution allows engineers to ensure their products meet designated specifications.

The test equipment includes MP1800A Signal Quality Analyzer (SQA), which is integrated with the MU181500B Jitter Modulation Source and MP1825B 4Tap Emphasis instrument. The solution generates pre-emphasis signals to conduct accurate tests and evaluations on high-speed devices, as well as more precise and complete signal integrity analyses up to 28 Gbit/s. Jitter tolerance testing is supported by transparent output of input data and clock jitter components without attenuation or amplification to ensure accurate, repeatable measurements.

The MP1800A is a modular BERT with a built-in Pulse Pattern Generator (PPG) that supports output of high-quality, low intrinsic jitter signals, as well as a built-in Error Detector (ED) with high input sensitivity of 10 mV. It supports signal analyses, including bathtub and Q measurements. The MU181500B module adds precision SJ, RJ, BUJ and SSC up to 28 Gbit/s to the MP1800A. Adding precision jitter components to the low-jitter, high-quality PPG waveforms supports jitter tolerance testing with high reproducibility and reliability, for easy configuration of tolerance test systems for next-generation CEI-28G-VSR interfaces.

Anritsu says this is uique because it operates up to 28 Gb/s, the MP1825B adds four taps for various pre/post-cursors to PPG signals, offering the perfect solution for evaluating the characteristics of printed circuit boards (PCBs), such as backplanes. The four taps can be set as pre- or post-cursors with 20 dB of setting range. The MP1825B allows users to compensate for losses in high-speed data communications channels or to simulate the effects of frequency dependent loss in those channels.