Synopsys provides full-stack big data analytics on its AI-driven EDA suite

To support analytics of petabytes of IC-design-data generated during manufacturing and testing of complex SoC chips with 10s billions transistors, Synopsys announced extension of its Synopsys.ai EDA suite with chip design industry’s first full-stack big data analytics solution. Vast amount of data includes heterogeneous design data types, such as timing routes, power profiles, die pass/fail reports, process control, and verification coverage metrics, are generated by EDA, testing, and IC production tools. Synopsys EDA data analytics solution to provide AI-driven insight and optimization to drive improvements across exploration, design, manufacturing, and testing. It uses latest advances in AI to curate and operationalize magnitudes of heterogenous, multi-domain data to speed up root-cause analysis and deliver higher design productivity, PPA, and parametric/manufacturing yield and test quality. Through AI-driven processes and procedures, the Synopsys.ai full-stack EDA suite with a big data analytics solution offers multi-domain data aggregation and curation, resulting in considerable productivity improvements and enhanced QoR. Deep data analytics help SoC chip designers to achieve more effective debug and optimization workflows. Before they have an impact on the quality and yield of the final product, IC vendors can quickly localize and fix problem regions throughout the...