|
Date:5th June 2012
IEC manufacturing test capability extended
by Corelis JTAG tools
Corelis, Inc. has announced the integration of Corelis
ScanExpress boundary-scan tools at IEC Electronics in Albuquerque,
NM. The ScanExpress system adds non-intrusive JTAG capabilities
to IEC Electronics' test arsenal which already includes
automated optical/x-ray inspection (AOI/AXI), in-circuit
test (ICT), flying probe, and functional test systems.
Ryan Jones, senior technical marketing engineer at Corelis,
explains the synergy, "As specialists in low volume,
high mix manufacturing, engineers at IEC Electronics understand
the high setup costs and long development times that traditionally
accompany in-circuit testing. Having ScanExpress tools available
in-house affords IEC the capability to provide their clients
with fast, comprehensive tests at a fraction of the cost
of traditional test methods."
The ScanExpress system includes a rapid test development
environment suited for contract manufacturers with diverse
clients. "Boundary-scan by its nature is ideal for
testing short manufacturing runs due to fast test development
and low setup requirements," comments Butch Thornburg,
senior test engineer at IEC Electronics. Thornburg said,
"I can develop boundary-scan tests with Corelis tools
in a matter of hours. Equivalent ICT tests take days, even
weeks to develop. Our boundary-scan projects have been so
successful that our defense customers now demand that we
perform boundary-scan DFT analyses on all new designs, providing
recommendations on how testability can be improved."
Author: Srinivasa Reddy N
|
