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Tektronix' owned Keithley's characterisation tool support III-V power semiconductor

Date: 16/01/2015
Tektronix' owned Keithley instruments has enhanced its latest release of automated characterisation suite (ACS) software with more testing capabilities for the development and characterization of power semiconductor devices and wafer level reliability (WLR) testing for device development and process quality improvement. The enhanced software supports fast-growing compound semiconductor such as Gallium Nitride(GaN) and Silicon Carbide (SiC) -based semiconductor devices.

Some of the new features include, high voltage capacitance-voltage (C-V) measurement libraries, and supporting instruments capable to source or sink up to 3,000V, and support for the new 10kV Model 2290 Power Supply for the same purpose.

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