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Jitter generation software for T1 E1 Lines

Date: 19/09/2013
GL Communications has announced the availability of jitter and pulse mask compliance test feature in GL's Dual T1 E1 Express (PCIe) Boards, Universal T1 E1 Boards, and tProbe T1 E1 Analyzer platforms.

GL’s Pulse Shape Measurement software can determine if the pulse shape fits within a “pulse mask” as specified by standards ITU G.703 and ANSI T1.102-1993. The software is available in both visual and tabular formats. Tabular formats are convenient for automation and scripted test environments.

GL explains its Jitter Measurement software allows evaluation of the jitter on either a tick-by-tick or a cumulative basis. In addition to these, the application recognizes the very slow variations in a clock signal (below 1 Hz), and the Frequency Offset or Deviations in clock rates.

Important Features:
Generates intrinsic jitter without any error as per G.823 standards
Generates user-defined jitter value against an input jitter tolerance mask to test DUTs capability to tolerate large amounts of generated jitter.
In conjunction with Jitter Measurement provides peak-to-peak jitter value for a given frequency at the system output
Evaluate the jitter in real-time on either a tick-by-tick or a cumulative basis