Advantest launches new test solution for complex SoCs

Advantest has announced test solution to perform massive multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores using its V93000 platform. Advantest explains test systems for mobile PMIC devices are required to conduct a very high volume of complex tests including as many as 2,000 tests for characterization, 500 tests at design verification and another 300 tests during production. These testers also said to be versatile to address SoC integration trends where they pack high-end digital circuits, analog and power-management functions in a single chip. The new V93000 Mobile PMIC solution uses high-density modules for massive parallel tests by featuring new high-density device power supply DPS128 with 128 channels of voltage/current (VI) resources per module to accurately source and measure both current and voltage. The per-pin time measurement unit (TMU) enables efficient measurement of high switching frequencies, duty cycles and fast rise/fall times found in today’s advanced power-management devices, says Advantest . The configuration is also flexible and expandable to meet future testing needs. This test solution supports testing chips with multi-supply voltages (MSV), which reduce power consumption by providing several domains to separate power distribution, and power-supply shut off (PSO), used to conserve...