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Date: 2nd Sept 2010
Cree demos 150mm SiC substrates to enhance
productivity
Cree said it has demonstrated150-mm (6- Inch) SiC (silicon
carbide) substrates with micropipe densities of less than
10/cm2. The current Cree standard for SiC substrates is
100-mm diameter material. Cree had demonstrated 100-mm (4-inch),
Zero-Micropipe, n-type SiC substrates back in May 2007.
So in a span of 3 years, Cree has come out with another
achievement in SiC semiconductor technology.
SiC is used in manufacturing opto-semiconductor devices
such as LEDs and also in making power switching devices
and RF power transistors for wireless communications. 150-mm
will increase the devices per substrate/wafer by more than
two times.
"Cree's achievement of 150-mm SiC substrates further
demonstrates Cree's leadership in SiC materials technology,"
said Dr. Vijay Balakrishna, Cree Materials product line
manager. Steve Kelley, Cree chief operating officer, added,
"We expect that 150-mm substrates can reduce device
cost, boost manufacturing output and expand our product
range".
For more information visit: www.cree.com
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