FormFactor qualifies one-touchdown 300-mm wafer probe card for DRAM sort test

FormFactor has announced the qualification of its one-touchdown 300-mm Wafer Probe card for DRAM Sort Test. With its Harmony eXP full-wafer contact probe card employing advanced TRE technology to simultaneously test all die on the DRAM wafer with existing tester resources.

The advanced probe card also allows the testing of the entire wafer at two temperatures, enabling sort testing at both hot and cold extremes. This dual-temperature capability helps IC manufacturers meet reliability and performance requirements at the low cost of test.

Device manufacturers use its Harmony eXP cards to leverage existing test equipment to increase total available test capacity.

FormFactor says that it has shipped the first Harmony eXP one-touchdown sort card to Elpida Memory for testing of DRAM devices.

"Our Harmony eXP probe card solution enables maximum throughput, which is critical to help our customers reduce their time-to-market," stated Stefan Zschiegner, senior vice president and general manager of FormFactor's DRAM Product Business Group. "FormFactor's long-standing commitment to R&D has allowed us to intercept the goal of one touchdown testing. We continue to push the limits of probe testing to ensure that both we and our customers remain on the cutting-edge of the test technology roadmap."

For more details visit www.formfactor.com