ee Herald                                  
Home | News | New Products | India Specific | Design Guide | Sourcing database | Student Section | About us | Contact us | What's New

News

   Date: 16th Oct 09

Aeroflex adds new LTE measurement capabilities to its PXI platform

Aeroflex has announced that it has added new LTE measurement capabilities to its PXI 3000 platform that features fast time to volume for RF components and LTE user equipment.

This new measurement suite option for the PXI 3000 uses low-cost modular PXI equipment to characterize LTE terminals, chipsets and RF components. LTE terminals will feature the coexistence of LTE with legacy standards in the same device, support for multiple cellular standards in a single test platform is key to improve production yield and reduce test times.

The new measurement suite is complemented by the new LTE waveform generation capabilities of Aeroflex IQCreator software, which supports the PXI 3000 Series and the Aeroflex 3410 Series of digital RF signal generators, making them ideal for LTE RF component test.

"The new LTE test support for the PXI 3000 Series further strengthens Aeroflex's LTE test offering and complements our other test platforms such as the 3410 and 7100, enabling the fastest path from R&D to low cost manufacturing test and providing reduced risk in achieving the best time to volume," said Tim Carey, PXI product manager at Aeroflex.

Availability:

IQCreator Version 8.10 is now available and can be downloaded from the Aeroflex website.
Version 8.10 of IQCreator is shipping now with all new 3020 Series PXI signal generator modules fitted with option 100.

For more details visit www.aeroflex.com

          
Home | News | New Products | India Specific | Design Guide | Sourcing database | Student Section | About us | Contact us | What's New
©2006 Electronics Engineering Herald