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Date: 06-10-16

Low noise MEMS for structural defect-diagnosis through vibration sensing

Analog Devices has launched new MEMS accelerometers ADXL354 and ADXL355 to measure vibration at low noise targeting applications such as detecting defects in structures like bridges, huge buildings, flyovers or any such vibration prone structures through wireless sensor networks. ADXL354 and ADXL355 accelerometers tilt stability delivers higher repeatability over temperature and time that is suitable for orientation and navigation systems in unmanned aerial vehicles using Inertial Measurement Units (IMUs) and inclinometers. “By providing repeatable tilt measurement under all conditions, the new accelerometers enable minimal tilt error without extensive calibration in harsh environments”, states ADI in its release. The ADXL354 and ADXL355 accelerometers deliver temperature stability with null offset coefficients of 0.15mg/C (max) to achieve lesser calibration and testing effort and achieve higher throughput for device OEMs. The hermetic package ensures that the end product conforms to its repeatability and stability specifications much longer. Other specifications include, they deliver output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25µ/vHz at less than 200µA current consumption.

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