Synopsys expanded its Virtualizer Development Kit (VDK) portfolio for Renesas' RH850 MCU with a virtual prototype for the new RH850/P1x series. This offer enables chassis electronic control units (ECUs) designers to start software development, integration and test months before physical hardware and testbenches are available.
"The scalability, performance and reliability of the Renesas RH850/P1x MCU series is ideal for our customers developing chassis applications," said Naoki Yada, senior manager of Automotive Control Technical Strategy Department at Renesas Electronics Corporation. "As software content and complexity of chassis applications increases, our customers benefit from our Center of Excellence collaboration with Synopsys by having access to a complete virtual prototyping solution from a preferred provider to accelerate software development, integration and test and deliver increasingly reliable products faster."
"The VDK for Renesas RH850's software debug and analysis tools, combined with support for Synopsys Saber, Mathworks Simulink and Vector CANoe tools enable system integration and testing using a virtual Hardware-in-the-Loop environment. The combined solution accelerates integration and functional safety testing (ISO 26262), resulting in higher ECU and vehicle software quality. Companies can further customize the VDK for RH850/P1x to support all versions of the RH850/P1x or P1x-C MCUs using the Virtualizer tool set and can also call on Synopsys' expert virtual prototyping services to accelerate customization." explained by Synopsys.
"Chassis and safety applications such as electric power steering, stability systems and brake systems are increasingly relying on more complex embedded software and must comply with the ISO 26262 functional safety standards," said John Koeter, vice president of marketing for IP and Prototyping at Synopsys. "Expanding our VDK portfolio for Renesas' RH850 MCUs with support for RH850/P1x helps Tier 1 and OEM companies perform earlier, faster and better software testing including fault and coverage testing for these applications."