Electronics Engineering Herald                 
Home | News | New Products | India Specific | Design Guide | Sourcing database | Student Section | About us | Contact us | What's New
Processor / MCU / DSP
Memory
Analog
Logic and Interface
PLD / FPGA
Power-supply and Industrial ICs
Automotive ICs
Cellphone ICs
Consumer ICs
Computer ICs
Communication ICs (Data & Analog)
RF / Microwave
Subsystems / Boards
Reference Design
Software / Development kits
Test and Measurement
Discrete
Opto
Passives
Interconnect
Sensors
Batteries
Others

New Products

  Date: 18/01/2015

Tektronix' owned Keithley's characterisation tool support III-V power semiconductor

Tektronix' owned Keithley instruments has enhanced its latest release of automated characterisation suite (ACS) software with more testing capabilities for the development and characterization of power semiconductor devices and wafer level reliability (WLR) testing for device development and process quality improvement. The enhanced software supports fast-growing compound semiconductor such as Gallium Nitride(GaN) and Silicon Carbide (SiC) -based semiconductor devices.

Some of the new features include, high voltage capacitance-voltage (C-V) measurement libraries, and supporting instruments capable to source or sink up to 3,000V, and support for the new 10kV Model 2290 Power Supply for the same purpose.

To know more on this visit the website:
http://www.keithley.com/products/semiconductor/characterizationsoftware



 
ADVT
Home | News | New Products | India Specific | Design Guide | Sourcing database | Student Section | About us | Contact us | What's New
©2010 Electronics Engineering Herald