Mentor Graphics has unveiled Kronos Cell Characterization and Analysis platform to produce accurate performance models for standard cells, I/Os, and complex cells design in deeper nodes of below 45nm.
The Kronos platform quickly generates accurate and complete timing/power models and incorporates unique methods for noise immunity and signal integrity to avoid design problems that otherwise might not be detected until failure analysis.
The Kronos Platform’s advanced algorithms and efficient job distribution reduces characterization time from weeks to days. During characterization, spice simulations are continuously monitored, and numerous data checks and recovery mechanisms significantly improve turn-around time by pinpointing specific model results and simulations if a problem is detected. The Kronos platform is tightly integrated with Eldo Classic SPICE simulator.
“Our customers know that sophisticated and robust Standard Cell Library analysis and characterization are of critical importance,” said Robert Hum, vice president and general manager, Deep Submicron Division (DSM), Mentor Graphics. “Our SPICE simulator, Eldo, has been optimized for cell characterization and used to drive this type of solution for many years. Now we have the opportunity to deeply integrate Eldo into a best-in-class characterization technology for optimal accuracy and performance.”