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Date: 27th July 2010
Aeroflex and Boeing SSED jointly develop
90nm RHBD digital ASICs
Aeroflex has entered into a license agreement and technology
development partnership with Boeing Research & Technology's
Solid State Electronics Development (SSED) for 90nm RHBD
digital Application Specific Integrated Circuits (ASICs).
This partnership's main focus will be to qualify the technology
node for aerospace and defense applications while they develop
the 45nm SOI and 32nm SOI of the RHBD library.
"Partnering with Boeing SSED and qualifying the 90nm
RHBD library will leverage government investments, Boeing
RHBD expertise, and nearly 30 years of Aeroflex Colorado
Springs history supplying RadHard integrated circuits to
the aerospace and defense communities," said Roger
Van Art, Aeroflex Colorado Springs Vice President of Strategic
Business. "Customers will be able to design RadHard
ASICs for space applications with this ASIC family to realize
significant dynamic power, cell density, and radiation-hardened
performance (TID, SEE, Dose Rate) benefits. In addition,
Aeroflex Colorado Springs' CAT1A Trusted accreditation in
Design, Test, Assembly, and MPW Aggregation services provides
customers with secure and assured access."
Warren Snapp, Boeing Research & Technology manager
of SSED, said that "We are excited to support a leading
developer of aerospace electronics to bring this enabling
new technology to the market. It will provide aerospace
systems developers with access to leading edge integrated
circuits to achieve the highest performance and system effectiveness.
The program will build on Boeing's 20 years of experience
in developing radiation hardened circuits on leading-edge
commercial fabrication processes by use of highly efficient
design techniques. This partnership will leverage the strengths
of each company to rapidly transition 90nm design capability
to program readiness maturity and support."
The main features of the UT90nHBD include:
1. Offers radiation hardened technology from 100 krad to
1Mrad(Si) total ionizing dose (TID).
2. It's intended to provide single event upset (SEU) at
over 5.0E-9 errors/bit-day, single event latchup of less
than 100 MeVcm2/mg at 125degC, and dose rate upset at greater
than 1.0E9 (Si)/sec.
3. All of Aeroflex's current offerings of Digital RadHard
ASICs are QML Q and V qualified.
Availability: The Customer Toolkit for the UT90nHBD
is available now. All QML qualification plans are scheduled
to be met by 2013.
For more information visit: www.aeroflex.com/radhardASIC
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